Study of DNA films by the CD, X-ray and polarization microscopy techniques

نویسندگان

  • V. N. Potaman
  • D. G. Alexeev
  • I. Ya Skuratovskii
  • A. Z. Rabinovich
  • L. S. Shlyakhtenko
چکیده

DNA films with psi +/- CD spectra have been investigated. X-ray analysis has shown the sign of the psi spectra to be independent of the secondary structure of DNA. The appearance of the psi spectra is attended by the formation of a characteristic polygonal texture of the cholesteric type in the DNA film.

برای دانلود متن کامل این مقاله و بیش از 32 میلیون مقاله دیگر ابتدا ثبت نام کنید

ثبت نام

اگر عضو سایت هستید لطفا وارد حساب کاربری خود شوید

منابع مشابه

Band-Gap Tuning Of Electron Beam Evaporated Cds Thin Films

The effect of evaporation rate on structural, morphological and optical properties of electron beam evaporated CdS thin films have been investigated. CdS thin film deposited by electron beam evaporation method in 12nm/min and 60nm/min evaporation rates on glass substrates. X-ray diffraction, scanning electron microscopy, UV-Vis-NIR spectroscopy and Atomic Force Microscopy were used to character...

متن کامل

The effect of saccharin on microstructure and corrosion behavior of nanocrystalline nickel thin films in alkaline solution

In this study the effect of crystallite size reduction and microstructure on the electrochemical corrosion behavior of nanocrystalline nickel (NC Ni) were investigated using Tafel polarization and electrochemical impedance spectroscopy (EIS) measurements in 10 wt.% NaOH. NC Ni coatings were produced by direct current electrodeposition using chloride baths in presence and absence of saccharin as...

متن کامل

Nano-structural Characterization of Post-annealed ZnO Thin Films by X-ray Diffraction and Field Emission Scanning Electron Microscopy

ZnO thin films were deposited on Si(400) substrates by e-beam evaporation technique, and then post-annealed at different annealing temperatures (200-800°C). Dependence of the crystallographic structure, nano-strain, chemical composition and surface physical Morphology of these layers on annealing temperature were studied. The crystallographic structure of films was studied using X-Ray Diffracti...

متن کامل

Investigations on structural and electrical properties of Cadmium Zinc Sulfide thin films

Nowadays, II – IV group semiconductor thin films have attracted considerable attention from the research community because of their wide range of application in the fabrication of solar cells and other opto-electronic devices. Cadmium zinc sulfide (Zn-CdS) thin films were grown by chemical bath deposition (CBD) technique. X-ray diffraction (XRD) is used to analyze the structure and crystallite ...

متن کامل

Investigations on structural and electrical properties of Cadmium Zinc Sulfide thin films

Nowadays, II – IV group semiconductor thin films have attracted considerable attention from the research community because of their wide range of application in the fabrication of solar cells and other opto-electronic devices. Cadmium zinc sulfide (Zn-CdS) thin films were grown by chemical bath deposition (CBD) technique. X-ray diffraction (XRD) is used to analyze the structure and crystallite ...

متن کامل

ذخیره در منابع من


  با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید

برای دانلود متن کامل این مقاله و بیش از 32 میلیون مقاله دیگر ابتدا ثبت نام کنید

ثبت نام

اگر عضو سایت هستید لطفا وارد حساب کاربری خود شوید

عنوان ژورنال:
  • Nucleic acids research

دوره 9 1  شماره 

صفحات  -

تاریخ انتشار 1981